Workshop title

Aims

The workshop aims to provide participants with a comprehensive understanding of advanced microscopy techniques, particularly scanning electron microscopy (SEM) and transmission electron microscopy (TEM), and their applications in materials science and life sciences.

Objectives

• Educational Overview: To offer participants an in-depth overview of SEM imaging strategies, analysis techniques, TEM solutions, and analysis methodologies tailored explicitly for materials science applications.
• Sample Preparation Importance: To emphasize the significance of sample preparation, especially by the dual beam (FIB/SEM), in achieving high-quality imaging and analysis results in TEM.
• Application Focus: To explore the various applications of TEM in materials science, including its use in analyzing nanomaterials, polymers, composites, minerals, and biological materials.
• Cross-disciplinary Insights: This section will highlight the interdisciplinary nature of TEM applications by discussing their relevance and workflows in materials science and life sciences, including single particle analysis, tomography, and significant volume analysis.
• Hands-on Experience: To provide practical demonstrations, hands-on sessions, and Q&A sessions throughout the workshop, enabling participants to gain practical experience in operating SEM and TEM instruments and performing sample preparation techniques.

By achieving these objectives, the workshop aims to equip participants with the knowledge, skills, and practical experience necessary to effectively utilize SEM and TEM techniques in their research, analysis, and experimentation in materials science and related fields.

Benefits from this Workshop

Gain a comprehensive understanding of various electron microscopy techniques used in materials science.

• Learn advanced imaging strategies and analysis methods for SEM and TEM.
• Acquire sample preparation techniques using Dual Beam (FIB/SEM).
• Explore TEM applications and workflows in materials science and life sciences.
• Enhance skills in automated sample preparations and 3D characterization using Dual Beam technology.
• Network with experts and peers in the field, fostering collaboration and knowledge exchange.

The workshop aims to provide diverse participants with valuable knowledge, practical skills, and networking opportunities in electron microscopy and its various applications across different sectors.

The expanded list of participants for the workshop would encompass:

1. Academics: Researchers, graduate students, and faculty members from Qatar University and other academic institutions interested in materials science and microscopy techniques.
2. Materials Science Professionals: Individuals working within the materials science field, including researchers, engineers, and technicians involved in materials characterization, development, and analysis.
3. Biological and Medical Professionals: Professionals engaged in biological and medical research interested in the applications of microscopy techniques, particularly SEM and TEM, in their respective fields.
4. Policymakers and Government Officials: Those involved in policymaking and governmental affairs who wish to gain insights into the implications of nanotechnology and materials science for policy decisions.
5. General Enthusiasts: Individuals with a general interest in science and technology, notably electron microscopy and its applications, regardless of their professional background.
6. Researchers: Material scientists, life science researchers, pharmaceutical researchers, chemists, physicists, and engineers conducting research at the nanoscale and beyond.
7. Industry Professionals: R&D personnel, quality control specialists, product development engineers, and other professionals working with advanced materials, nanomaterials, and biomaterials.
8. Students: Graduate and undergraduate students pursuing degrees in materials science, engineering, and related fields who wish to enhance their understanding of microscopy techniques and their applications in research and industry.

• To stay updated with the latest advancements in electron microscopy techniques.
• To gain practical insights and hands-on experience in SEM, TEM, and Dual Beam technology.
• To explore diverse electron microscopy applications in materials science and life sciences.
• To network with industry experts and peers, facilitating potential collaborations and career opportunities.
• To enhance skills and expertise, making valuable contributions to research and development projects.

The Central Laboratories Unit (CLU), Research and Graduate Studies Sector at Qatar University (QU), is pleased to offer an insightful full-day workshop program on the investigative use of electron microscopy in integrated research, development, and innovation in association with ThermoFisher Scientific.

The workshop, scheduled for April 25, 2024, at Qatar University's Research Complex (H10) Auditorium in Doha, comprehensively explores electron microscopy techniques vital to materials and life sciences. Structured with an opening session followed by three focused sessions, participants will delve into the intricacies of Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), and advanced applications such as Dual Beam Technology for sample preparation and 3D characterization. Through lectures, discussions, and potential practical demonstrations, attendees will gain invaluable insights into imaging strategies, analysis methodologies, and the significance of electron microscopy in diverse scientific disciplines, fostering a deeper understanding of cutting-edge research methodologies.

The course content covered the following topics.

• Overview of SEM and TEM techniques in materials science.
• Imaging strategies and analysis methods for SEM.
• Importance of sample preparation using Dual Beam (FIB/SEM) technology.
• Applications and workflows of TEM in materials science and life sciences.
• Automated sample preparations and 3D characterization using Dual Beam technology.
• Case studies and practical demonstrations illustrating the use of electron microscopy in various research areas.